SNEC PV
KLA’s Oskar Amster will present “KLA Optical and Stylus Profiler Applications in the Crystalline Silicon/Perovskite Solar Cell Manufacturing Process” at the SNEC PV Photovoltaic Power Conference & Exhibition. The presentation will occur on Friday, June 14, 10:00 am – 10:15 am, Session 6 (Thin Films and Perovskites), Grand Ballroom 3.
The SNEC PV Photovoltaic Power Conference & Exhibition is among the leading international fairs and conferences for the photovoltaic industry. The acronym "SNEC" stands for "Solar New Energy Convention". Annually, industry experts gather at the exhibition to present and discuss innovations and current developments in solar energy.
Related Products
Solar Zeta
3D Optical Profilometer Metrology for High Resolution Measurement of Solar Cell Texture, Busbars and Finger Lines
Learn MoreZeta-20
The Zeta-20 benchtop 3D non-contact optical profilometer features patented ZDot™ technology and flexible multi-mode optics for measurement of 3D surface topography, film thickness and automated defect inspection. The High Resolution HR configuration is designed specifically for advanced solar applications.
Learn MoreZeta-20HR
The Zeta-20HR configuration is designed to address advanced solar cell metrology requirements.
Learn More