Enabling zero defectivity roadmap for sic based power devices using candela

Oct 06, 2020

The reliability requirement for semiconductor chips for automotive applications are much stringent than most other semiconductor applications, as these chips are critical to the function and safety of vehicles. The need of the industry is to have chips working reliably for a very long period of time, leading to automotive IC manufacturers’ pursuit of Zero Defects standards. Implemented in a wide range of automotive subsystems, power devices require the same quality standards as other automotive ICs. On October 6, Varun Gupta, KLA Instruments Applications Manager, will discuss how Candela® 8520, our latest specialized inspection system for SiC substrate and epitaxy wafers help manufacturers of power devices achieve automotive defect standards.

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