KLA Instruments Group –
TMS, Booth 525

See our latest nanomechanical testers and optical profilers at TMS 2020

Image of Nano Indenter® G200X

Latest offering from Nano Indenter® G200 series

  • The Nano Indenter® G200X can be used for nanomechanical property measurements, scanning probe microscopy, high temperature measurements and conductive nanoindentation
  • Applications include hardness, Young’s modulus, complex modulus of polymers, gels and biological tissue, and strain rate sensitivity of thin metallic films
  • Optional applications include frequency-specific testing, quantitative scratch and wear testing, integrated probe-based imaging, high-temperature testing and custom test protocols
Angled image of Profilm3D

Profilm3D/Profilm3D-200: affordable, industry-standard optical profilers

  • The Profilm3D family of optical profilers use industry-standard white-light-interferometry (WLI) and optional phase-shifting-interferometry (PSI) to produce high-quality surface profiles.
  • Standard features include automated XY stage with 100 or 200mm travel, autofocus, four-position turret, tip/tilt stage, and 500um piezo travel.
  • Applications: surface roughness, step heights, etch depth, dimensional measurements, and more.

Schedule a demo at TMS 2020.



Data Transfer

Analyze your surface images for free at www.profilmonline.com

Compound Semi

Stylus Profilers | Optical Profilers | Nanoindenters | Thin Film Reflectometers

Compound Semi

Visit our website for more information on our tool applications in both research and production environments.

Are you sure?

You've selected to view this site translated by Google Translate.
KLA China has the same content with improved translations.

Would you like to visit KLA China instead?



If you are a current KLA Employee, please apply through the KLA Intranet on My Access.