Product Description
Thin-film thickness of samples up to 450mm in diameter are mapped quickly and easily with the F50 advanced spectral reflectance system. The motorized R-Theta stage moves automatically to selected measurement points and provides thickness measurements as fast as two points per second. The high-precision, high-lifetime stage can perform millions of measurements and is well suited to production environments.
Product Features
- Industry-leading tabletop thin-film measurement systems
 - Intuitive analysis software standard with every system
 - Library with over 130 materials included with every system
 - USB powered
 - 24-hour (M-F) phone, email, and online support from highly trained application engineers
 - System package includes integrated spectrometer/light source unit, flattening filter, reflectance standards, thickness standards and more!
 
Applications
Automated thin-film thickness mapping of most smooth, non-metallic film layers including:
- SiO2
 - Photoresist
 - SiNx
 - Polymer layers
 - DLC
 - Polyimide
 - Polysilicon
 - Amorphous Silicon
 
Industries
Semiconductor Fabrication
- Photoresist, oxides/nitrides/SOI, wafer backgrinding
 
LCDs
- Cell gaps, polyimide, ITO and other TCOs
 
Optical Coatings
- Hardcoat thickness, Anti-reflection coating
 
MEMS
- Photoresist
 - Silicon membranes
 
Look at the Industries tab for additional details.