Product Description
The Candela 7100 series advanced defect detection and classification system is designed specifically for hard disk drive substrates and media. A high-powered dual-wavelength laser is optimized for current defect of interest (DOI) challenges, and multi-channel scatter detectors provide enhanced sensitivity for classification of sub-micron pits, bumps, particles, and buried defects on a full range of substrates. The capability and stability of the 7100 series ensures that one platform can be used for multiple process control application points.
Features
- Detects and classifies sub-micron pits, bumps, particles, buried defects on metal and glass, substrates and media with full disk defect maps
- Provides faster time to results through full disk maps, with classified defects and actionable data output
- Reduces dependence on off-line inspection technologies (AFM, SEM, TEM, etc.) resulting in reduced overall cost of ownership
- Available in either a manual (7110) or fully-automated (7140) configuration
Use Cases
- Defect inspection
- Scratch and ridge inspection
- Particle and stain inspection
- Laser texture analysis
- Carbon uniformity analysis and carbon void inspection
- Recording layer and soft underlayer mapping
- Lube uniformity analysis
- Magnetic imaging
Options
- Precision diamond scribe
- High Sensitivity (HS) option
- Magnetic imaging
- Offline software large form factor software license
